Electron Microscope, Scanning - Tescan Lyra3 GMU FIB SEM

A state of the art SEM with Schottky field emission cathode in combination with gallium Focused Ion Beam (FIB) column and Gas Injection System (GIS).

SEM

 

Manufacturer:                Tescan
Model No.:                        Lyra3 GMU FIB SEM
Year of manufacture:  2013
Year acquired:                2014
Location:                          Parsons Room NB-17AD

Specifications:

  • Combined FE-SEM/FIB field emission microscope
  • High brightness Schottky emitter for high-resolution/high current/low-noise imaging
  • FIB column for site specific analysis, deposition, ablation of materials, and ion beam lithography
  • Automatic FIB cutting and signal acquiring followed by 3D reconstruction with 3D visualization
  • Standard Secondary Electron (SE), Back-Scatter Electron (BSE), and Cathodoluminescence (CL) detectors
  • In-beam SE and BSE detectors
  • Edax EDS and EBSD detectors for elemental analysis and examination of crystallographic orientation of materials
  • Ga liquid metal ion source
  • Magnification from 4X to 1,000,000X (at 1kV to 30kV)
  • Tri monitor set up with additional 60” common display

Available Accessories:

  • Gatan tensile/compression stage is available for performing dynamic material property studies with synchronized image and data acquisition. Maximum load is 2,000 Newtons

Principal scientist: Nancy Cherim

View UIC Knowledge Base

The Knowledge Base contains forms, instruction and training material, minutes, policies, tools and other resources to support your research efforts by topic area.


Contact Information

W123 Parsons Hall
Durham, NH 03824
Phone: (603) 862-2790


Rates

UNH Rate: 
$80.00/hour  assisted
$33.00/hour  unassisted

Non UNH academic Rate: 
$160.00/hour  assisted
$66.00/hour   unassisted

Industry Rate:
$250.00/hour assisted
$168.00/hour unassisted