A state of the art SEM with Schottky field emission cathode in combination with gallium Focused Ion Beam (FIB) column and Gas Injection System (GIS).
Manufacturer: Tescan
Model No.: Lyra3 GMU FIB SEM
Year of manufacture: 2013
Year acquired: 2014
Location: Parsons Room NB-17AD
Specifications:
- Combined FE-SEM/FIB field emission microscope
- High brightness Schottky emitter for high-resolution/high current/low-noise imaging
- FIB column for site specific analysis, deposition, ablation of materials, and ion beam lithography
- Automatic FIB cutting and signal acquiring followed by 3D reconstruction with 3D visualization
- Standard Secondary Electron (SE), Back-Scatter Electron (BSE), and Cathodoluminescence (CL) detectors
- In-beam SE and BSE detectors
- Edax EDS and EBSD detectors for elemental analysis and examination of crystallographic orientation of materials
- Ga liquid metal ion source
- Magnification from 4X to 1,000,000X (at 1kV to 30kV)
- Tri monitor set up with additional 60” common display
Available Accessories:
- Gatan tensile/compression stage is available for performing dynamic material property studies with synchronized image and data acquisition. Maximum load is 2,000 Newtons
Principal scientist: Nancy Cherim
The Knowledge Base contains forms, instruction and training material, minutes, policies, tools and other resources to support your research efforts by topic area.
- UIC: Online Instrument Reservation
- UIC: Scanning Electron Microscope Brochure
- UIC: Training Request Form
- UIC: Sample Submission Form
W123 Parsons Hall
Durham, NH 03824
Phone: (603) 862-2790
UNH Rate:
$80.00/hour assisted
$33.00/hour unassisted
Non UNH academic Rate:
$160.00/hour assisted
$66.00/hour unassisted
Industry Rate:
$250.00/hour assisted
$168.00/hour unassisted
