XPS

XPS

 

xpsX-Ray Photoelectron Spectrometer

Kratos axis HS XPS system

 

The x-ray photoelectron spectrometer is a surface elemental analysis instrument and can penetrate the sample surface of up to 30 Au deep.  It can do surface chemical mapping and depth profiling of metallic, semi-metallic, and non-metallic samples as deep as 1 nm.  The system is equipped with five detectors and has a charge neutralization system for insulated samples.   This instrument has dual x-ray guns Mg/Al source or the Al monochromatic source.  It also has an ion etch gun for performing depth profiling.

 

 

 

 

 

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