UIC

UNH to Receive Scanning Electron Microscope

UNH has recently received a NSF Major Research Instrumentation award for a new Focused Ion Beam Scanning Electron Microscope (FIB-SEM).  The unit will be housed at the University Instrumentation Center (UIC) in the basement of Parsons Hall.  The grant is a result of a collaborative proposal developed by investigators from Mechanical Engineering, Earth Sciences, Materials Science, and the UIC.  Expect to hear more about this in February 2014.

Focus On: Transmission Electron Microscope (TEM)

Did you know that RCI’s University Instrumentation Center (UIC) is home to the electron microscope facility in Kendall Hall that houses a Zeiss/LEO 922Ω Transmission Electron Microscope (TEM)? 

Subscribe to RSS - UIC
Bookmark and Share