"I really enjoyed seeing all the cool specimens with the SEM. I love science even more now!" exclaimed Brynn, age 12.
On January 12, the University Instrumentation Center (UIC) introduced students in New York to the nanoscale world of Scanning Electron Microscopy (SEM). This outreach session was well-received by the students and teachers of Mechanicville Junior/Senior High School. The students’ curiosity was clearly piqued by this opportunity to see, at the nanoscale level, the intricate details of such samples as a velvet mite, an apple leaf, and a fruit fly in a spider web.
On January 7th and 8th, the University Instrumentation Center (UIC) at the University of New Hampshire hosted a free workshop to demonstrate the 3D capabilities of their Tescan Lyra scanning electron microscope (SEM). This two day workshop was attended by engineers and scientists from a variety of manufacturing, research, and testing service organizations including UNH, a high tech material science company, an injection molding company, several analytical laboratories and several major manufacturing companies.
UNH has recently received a NSF Major Research Instrumentation award for a new Focused Ion Beam Scanning Electron Microscope (FIB-SEM). The unit will be housed at the University Instrumentation Center (UIC) in the basement of Parsons Hall. The grant is a result of a collaborative proposal developed by investigators from Mechanical Engineering, Earth Sciences, Materials Science, and the UIC. Expect to hear more about this in February 2014.