"I really enjoyed seeing all the cool specimens with the SEM. I love science even more now!" exclaimed Brynn, age 12.
On January 12, the University Instrumentation Center (UIC) introduced students in New York to the nanoscale world of Scanning Electron Microscopy (SEM). This outreach session was well-received by the students and teachers of Mechanicville Junior/Senior High School. The students’ curiosity was clearly piqued by this opportunity to see, at the nanoscale level, the intricate details of such samples as a velvet mite, an apple leaf, and a fruit fly in a spider web.
The UNH Instrumentation Center (UIC) held an open house in October to celebrate the opening of UNH’s new Imaging Core facility, and to spread the word about the recent acquisition of a Tescan Lyra Focused Ion Beam - Scanning Electron Microscope (FIB-SEM).
The University Instrumentation Center is a core University wide facility dedicated to the advancement of the research and academic missions of UNH and is open and available to all faculty, staff, and students.
UNH has recently received a NSF Major Research Instrumentation award for a new Focused Ion Beam Scanning Electron Microscope (FIB-SEM). The unit will be housed at the University Instrumentation Center (UIC) in the basement of Parsons Hall. The grant is a result of a collaborative proposal developed by investigators from Mechanical Engineering, Earth Sciences, Materials Science, and the UIC. Expect to hear more about this in February 2014.