UNH has recently received a NSF Major Research Instrumentation award for a new Focused Ion Beam Scanning Electron Microscope (FIB-SEM). The unit will be housed at the University Instrumentation Center (UIC) in the basement of Parsons Hall. The grant is a result of a collaborative proposal developed by investigators from Mechanical Engineering, Earth Sciences, Materials Science, and the UIC. Expect to hear more about this in February 2014.
Zeiss/LEO 922 Omega Transmission Electron Microscope (TEM)
The transmission electron microscope is a unique and powerful microscope. It can magnify images from 80X to 1,000,000X. This microscope has accelerating voltages from 120 to 200 KV. The resolution line is 0.12 nm.
UV/Vis is used to analyze inorganic or organic compounds, biologically significant samples, liquids or solids. This instrument has an accuracy of 0.1 nm in the UV/Vis range and 0.4 in the NIR range. It has 0.00001 nm resolution, a 0-10 ABS range and the wavelength range is 3300 nm to 175 nm.
IR provides information on molecular structure and functional groups. Samples can be analyzed in liquid or solid form. The system is controlled with Omnic 8 software. The spectral resolution is 0.4 cm-1 and the spectral range is 7800 cm-1 to 350 cm-1.