UNH to Receive Scanning Electron Microscope

UNH to Receive Scanning Electron Microscope

Nov 26, 2013

UNH has recently received a NSF Major Research Instrumentation award for a new Focused Ion Beam Scanning Electron Microscope (FIB-SEM).  The unit will be housed at the University Instrumentation Center (UIC) in the basement of Parsons Hall.  The grant is a result of a collaborative proposal developed by investigators from Mechanical Engineering, Earth Sciences, Materials Science, and the UIC.  Expect to hear more about this in February 2014.

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